Shanghai, China

Wenlong Zhai

This inventor holds 2 USPTO granted patents and 1 EPO patent. Top assignee: Shanghai Ruiyu Biotech Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wenlong Zhai. Retrieved from https://idiyas.com/inventor/wenlong-zhai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 2.0

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Company Filing History:


Years Active: 2026

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2 patents (USPTO):Explore Patents

Title: Wenlong Zhai - Innovator in Microscopic Imaging Systems

Introduction

Wenlong Zhai is an inventor based in Shanghai, China. He is currently associated with Shanghai Ruiyu Biotech Co., Ltd. Although he has not yet been granted any patents, his work focuses on advancements in microscopic imaging systems.

Latest Patent Applications

Wenlong Zhai has submitted several patent applications, including:

1. **Microscopic Imaging Systems** - This application provides a microscopic imaging system that includes a sample platform control structure and/or a platform mechanism. The system features a base, an X platform, an X platform moving mechanism, a sample platform, a sample platform moving mechanism, a primary guide rail, and a secondary guide rail.

2. **Reflection Mechanisms of Microscopic Imaging Devices, Microscopic Imaging Devices and Methods Thereof** - This application describes a reflection mechanism of a microscopic imaging device. The device includes a carrier assembly with a carrier table designed to support a sample for observation. It also features an imaging assembly that captures a microscopic image of the sample. The imaging assembly consists of a camera unit and a lens unit, with capabilities for adjusting object-image distances.

Conclusion

Wenlong Zhai is making significant contributions to the field of microscopic imaging systems through his innovative patent applications. His work has the potential to advance the capabilities of imaging technologies in various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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