Suzhou, China

Wenlong Feng


Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Innovations of Wenlong Feng: The Terrace Detection Device

Introduction

Wenlong Feng, an innovative inventor based in Suzhou, China, has made significant contributions to the field of technology with his inventive prowess. His dedication to improving measurement accuracy is demonstrated through one of his notable patents, aimed at enhancing the precision of terrace data acquisition.

Latest Patents

Wenlong Feng holds a patent for a "Terrace Detection Device and Use Method of Terrace Detection Device." This invention comprises a target vehicle and a measuring vehicle, both controlled by a central controller. The target vehicle includes a first mobile vehicle equipped with a target, while the measuring vehicle features a second mobile vehicle with a measuring head. This innovative setup allows for integrated estimation of the to-be-measured terrace, significantly improving the accuracy of the acquired terrace data.

Career Highlights

Currently, Wenlong Feng is employed at Suzhou Fangshi Technology Co., Ltd., where he engages in cutting-edge research and development projects. His ingenuity in creating practical solutions has set a standard for innovation within his company. His patent is an excellent showcase of his technical abilities and forward-thinking approach to problem-solving.

Collaborations

Feng collaborates closely with fellow innovators Siqiao Li and Xiao Zong, contributing to a dynamic working environment that fosters creativity and invention. Together, they work on various projects that reflect their shared commitment to advancing technology and innovation.

Conclusion

Wenlong Feng’s inventions, particularly his terrace detection device, underscore his role as a key figure within the realm of innovation. His work not only exemplifies the spirit of invention but also contributes valuable advancements to technology, paving the way for further developments in measurement accuracy.

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