Sunbury-on-Thames, United Kingdom

Wenjuan Sun

This inventor holds 1 USPTO granted patent. Top assignee: Baker Hughes Holdings LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wenjuan Sun. Retrieved from https://idiyas.com/inventor/wenjuan-sun-0cf2djwn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Wenjuan Sun and Computed Tomography Calibration

Introduction

Wenjuan Sun is an inventor based in Sunbury-on-Thames, United Kingdom. The available information lists 1 patent associated with Sun and identifies Baker Hughes Holdings LLC as the company connected with the invention.

Latest Patents

Sun’s listed patent is “Apparatus and Method for Computed Tomography System Calibration.” It describes a system and method for calibrating a computed tomography (CT) scanner by scanning a calibration apparatus and identifying scan edges on two calibration layers, along with the floating point of an opening.

The method measures longitudinal scan dimensions from each scan edge to the floating point. It then calculates a scan overhang from the difference between those dimensions, compares that result with the calibration overhang, and uses the comparison to determine a level of uncertainty for the CT scanner.

Career Highlights

The available details connect Sun’s work to CT scanner calibration and measurement accuracy. The invention’s approach uses calibration-layer scan data to assess scanner uncertainty.

Collaborations

Xuhui Yao, identified as a woman, is listed as Sun’s coworker. The available information does not specify her role in the patent or the invention.

Conclusion

Wenjuan Sun’s listed patent addresses CT scanner calibration by comparing measured scan overhang with a calibration reference to assess uncertainty.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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