Kaohsiung, Taiwan

Weng-Jay Lee

This inventor holds 1 USPTO granted patent. Top assignee: China Steel Corporation. Active years: 1990.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Weng-Jay Lee. Retrieved from https://idiyas.com/inventor/weng-jay-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1990

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1 patent (USPTO):Explore Patents

Title: Weng-Jay Lee: Innovator in Eddy Current Inspection Technology

Introduction

Weng-Jay Lee is a notable inventor based in Kaohsiung, Taiwan. He has made significant contributions to the field of automated inspection technology. His innovative approach focuses on enhancing the efficiency and effectiveness of inspecting columnar bodies.

Latest Patents

Weng-Jay Lee holds a patent for an "Automated apparatus for inspecting columnar bodies by eddy current method." This invention includes a stockup zone, a feed zone, and eddy current inspection equipment. The design allows columnar bodies to be fed end to end in an abutting relationship, while detection equipment monitors for blockages and enables their dislodgement.

Career Highlights

Weng-Jay Lee is currently employed at China Steel Corporation, where he applies his expertise in engineering and technology. His work has been instrumental in advancing inspection methods within the steel industry.

Collaborations

Weng-Jay Lee collaborates with talented coworkers, including Chung-Mei Chen and Jenn Fu Yang. Their combined efforts contribute to the innovative projects at China Steel Corporation.

Conclusion

Weng-Jay Lee's contributions to automated inspection technology demonstrate his commitment to innovation and excellence. His patent reflects a significant advancement in the field, showcasing the potential for improved efficiency in industrial applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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