Shanghai, China

Wenda Zhu

This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignees: Baker Hughes Holdings LLC, Baker Hughes Oilfield Operations LLC. Active years: 2024-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wenda Zhu. Retrieved from https://idiyas.com/inventor/wenda-zhu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

% Patents Active = 100.0

Average Co-Inventor Count = 3.7

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2024-2026

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2 patents (USPTO):Explore Patents

Title: Inventor Spotlight: Wenda Zhu

Introduction

Wenda Zhu is a remarkable inventor based in Shanghai, China, known for her innovative contributions to the field of inspection devices. Her work plays a pivotal role in enhancing operational efficiency within industries, particularly in oilfield operations.

Latest Patents

Wenda holds one patent for her invention related to an inspection device. This patent demonstrates her commitment to developing technology that improves safety and effectiveness in oil exploration and production processes.

Career Highlights

Currently, Wenda Zhu is employed at Baker Hughes Oilfield Operations LLC, where she leverages her expertise to drive technological advancements in the oil and gas sector. Her dedication and innovative mindset have positioned her as a valuable asset to her team.

Collaborations

Throughout her career, Wenda has collaborated with talented professionals such as Appu Gopakumar and Ralf Ratering. Together, they work towards developing cutting-edge solutions that address the challenges in their industry.

Conclusion

Wenda Zhu's contributions to innovation in inspection devices exemplify the impact of her work on the oilfield operations sector. Her collaborations and achievements continue to inspire many in the field of technology and engineering.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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