Ningde, China

Wenchao Wei

This inventor holds 1 USPTO granted patent and 3 published patent applications and 1 EPO patent. Top assignee: Contemporary Amperex Technology (Hong Kong) Limited. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wenchao Wei. Retrieved from https://idiyas.com/inventor/wenchao-wei

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Wenchao Wei and Battery OCV Detection

Introduction

Wenchao Wei is an inventor associated with Ningde, China. His patent work includes a method and device for detecting the open-circuit voltage (OCV) of battery materials, with a focus on improving inspection efficiency.

Latest Patents

Wei is credited with 1 patent: “OCV Detection Method and Detection Device.” The invention describes OCV testing battery materials at a designated detection location and, when results are unqualified, transferring materials to a replacement location. It also provides for testing transferred materials at a transfer station and separating defective products from good products. By checking both regularly processed and transferred materials, the method aims to detect more batteries per unit of time and improve inspection efficiency.

Career Highlights

Wei’s listed company affiliations include Contemporary Amperex Technology (Hong Kong) Limited and Shanghai Spaceflight Institute of TT&C and Telecommunication. His patent reflects work related to battery testing and production processes.

Collaborations

Wei’s listed coworkers include Wei Cao and Wentao Chen. These names provide context for his professional network, though the supplied information does not specify particular joint projects.

Conclusion

Wenchao Wei’s patent focuses on a battery OCV inspection process designed to increase testing throughput while distinguishing defective materials from good products.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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