Wen-Ping Wang

Title: Innovations by Wen-Ping Wang

Introduction

Wen-Ping Wang is a notable inventor based in Shenzhen, China. He has made significant contributions to the field of electronic device testing and scanning technologies. With a total of 3 patents to his name, his work reflects a commitment to advancing innovation in electronic testing solutions.

Latest Patents

Wang's latest patents include a "Test fixture and testing device having the same." This invention features a test fixture that automatically places an electronic device for testing. It includes a carrying module for holding the electronic device, a cover board module for supporting the carrying module, and a test module. The cover board module is equipped with an inductor that senses the placement of the electronic device on the carrying module. The test module consists of a driving member, a test plug, a detector, and an adapter that is movably positioned on the carrying module. When the inductor signals that the electronic device is in place, the test plug is driven into the socket of the adapter, initiating the testing procedure.

Another significant patent is the "Scanning device and scanning method." This invention is designed to scan electronic devices and includes a first driving device and a scanner mounted on it. The platform supports the electronic device while the first driving device moves the scanner to scan the device. The scanning device can control the first driving device to move a preset distance and scan the electronic device effectively.

Career Highlights

Wen-Ping Wang has worked with prominent companies such as Fu Tai Hua Industry (Shenzhen) Co., Ltd. and Hon Hai Precision Industry Co., Ltd. His experience in these organizations has contributed to his expertise in electronic device testing and scanning technologies.

Collaborations

Wang has collaborated with notable colleagues, including Xiao-Jun Nie and Jin Wen, who have contributed to his projects and innovations.

Conclusion

Wen-Ping Wang's contributions to electronic device testing and scanning technologies highlight his innovative spirit and dedication to advancing the field. His patents reflect a deep understanding of the challenges in electronic testing, paving the way for future advancements.