Wen-Hung Lai

Title: Innovations of Wen-Hung Lai

Introduction

Wen-Hung Lai is a notable inventor based in Taoyuan County, Taiwan. He has made significant contributions to the field of misalignment detection devices, holding a total of 3 patents. His work is instrumental in enhancing the accuracy and reliability of various technological applications.

Latest Patents

Wen-Hung Lai's latest patents focus on advanced misalignment detection devices. One of his inventions comprises a misalignment detection device that includes a first substrate, at least one integrated circuit, a second substrate, a third substrate, and at least one detection unit. This device is designed to output a fault signal in response to a positioning shift occurring in at least one of the pressing regions. Another patent features a similar misalignment detection device, which includes a substrate with first and second positioning pads. The integrated circuit in this device has corresponding positioning bumps that interact with the pads, allowing the detection unit to signal any positional discrepancies.

Career Highlights

Wen-Hung Lai is currently employed at AU Optronics Corporation, where he continues to innovate and develop new technologies. His expertise in misalignment detection has positioned him as a key player in the industry.

Collaborations

Wen-Hung has collaborated with several talented individuals, including Chun-Yu Lee and Shih-Ping Chou, who contribute to the innovative environment at AU Optronics Corporation.

Conclusion

Wen-Hung Lai's contributions to misalignment detection technology demonstrate his commitment to innovation and excellence in his field. His patents reflect a deep understanding of the complexities involved in ensuring precision in technological applications.