Lowdong Town, Taiwan

Wen-Hsuan Hsieh

This inventor holds 1 USPTO granted patent. Top assignee: Quisda Corporation. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wen-Hsuan Hsieh. Retrieved from https://idiyas.com/inventor/wen-hsuan-hsieh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Innovator Spotlight: Wen-Hsuan Hsieh

Introduction

Wen-Hsuan Hsieh is a talented inventor based in Lowdong Town, Taiwan. She has made significant contributions to the field of image processing through her innovative patent. Her work exemplifies the intersection of technology and creativity, showcasing her dedication to advancing image correction systems.

Latest Patents

Wen-Hsuan Hsieh holds a patent for "Image correction systems and methods thereof." This patent describes a method for image correction that involves receiving an image and reading the pixels within it. A frequency value is calculated for each color scale value, indicating how many pixels correspond to each value. The method includes acquiring a color-scale threshold and determining lower and upper limits to generate an updated image by replacing pixel values with a weighted value.

Career Highlights

Wen-Hsuan Hsieh is currently associated with Quisda Corporation, where she applies her expertise in image processing. Her innovative approach has led to advancements in the field, making her a notable figure in her industry. With her patent, she has demonstrated her ability to solve complex problems through technology.

Collaborations

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Conclusion

Wen-Hsuan Hsieh's contributions to image correction technology highlight her innovative spirit and dedication to her field. Her patent serves as a testament to her skills and the impact she has made in the realm of image processing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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