Taoyuan, Taiwan

Wen-Fong Huang

This inventor holds 1 USPTO granted patent. Top assignee: Delta Electronics, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wen-Fong Huang. Retrieved from https://idiyas.com/inventor/wen-fong-huang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Wen-Fong Huang and Battery Rack Failure Detection

Introduction

Wen-Fong Huang is an inventor associated with Taoyuan, Taiwan, and Delta Electronics, Inc. Her patent work includes a method and system for detecting failures in battery racks. The available information identifies 1 patent.

Latest Patents

Huang’s patent, “Failure Detection Method and Failure Detection System for Battery Racks,” describes monitoring voltage differences across battery racks. The method continuously calculates voltage-difference data and uses the data collected from each rack to compute a standard deviation. When that deviation exceeds a preliminary threshold, the system compares voltage trends from two periods and calculates their intersection to determine the trend status. It also calculates a voltage slope for the second period. If the trend status is abnormal and the slope exceeds a specified threshold, the system generates an alarm identifying the battery cell experiencing an overvoltage condition.

Career Highlights

Huang’s disclosed invention focuses on identifying abnormal voltage behavior in battery racks and pinpointing the affected cell. This approach combines statistical analysis, trend comparison, and slope thresholds to support battery failure detection.

Collaborations

Jyun-Kai Chen and Shih-Hung Liu are listed as Huang’s coworkers. The provided information does not specify their roles in the patent or their particular contributions.

Conclusion

Wen-Fong Huang’s patent describes a structured approach to detecting battery rack failures and locating cells with overvoltage conditions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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