This inventor holds 1 USPTO granted patent. Top assignee: National Science Council. Active years: 2002.
Company Filing History:
Years Active: 2002
Title: The Innovations of Wen-Ben Jone: A Pioneer in Built-In Self-Test Architecture
Introduction
Wen-Ben Jone, an innovative inventor based in Chiayi, Taiwan, has made significant contributions to the field of integrated circuit testing. With one patent to his name, his work focuses on enhancing the efficiency of memory testing within chip architectures, a critical aspect of semiconductor technology.
Latest Patents
Wen-Ben Jone holds a patent titled "Built-in Self Test for Multiple Memories in a Chip." This inventive architecture proposes a novel approach to testing various memory units in parallel utilizing a single address generator. The system allows for the testing of multiple memories simultaneously, significantly optimizing performance and reliability. When the address generated exceeds the capacity of any memory, that memory is automatically turned off by a Built-In Self-Test (BIST) controller. Each word in the memories is assessed through a scan-in/out method, where D flip-flops in each memory's input and output ports form two interconnected scan chains, simplifying the testing process. This setup requires only one data input and one data output for the entire architecture, while the outputs from all scan chains are routed to a self-checking mechanism for fault analysis. The complete testing system—comprising the address generator, data generator, self-checker, and test controller—is all integrated within the chip.
Career Highlights
Wen-Ben Jone is associated with the National Science Council, contributing his expertise to advance research in integrated circuits. His role in innovating built-in self-test mechanisms showcases his commitment to improving semiconductor design and functionality.
Collaborations
Throughout his career, Wen-Ben Jone has collaborated with esteemed colleagues, including Kuen-Jong Lee and Jing-Yane Wu. These partnerships have facilitated the exchange of ideas and have driven the development of cutting-edge testing solutions within the integrated circuit field.
Conclusion
Wen-Ben Jone's innovative work on built-in self-test architecture for memories in a chip represents a significant advancement in the semiconductor industry. His contributions not only enhance the capabilities of memory testing but also underscore the importance of collaboration in fostering technological progress. As the field continues to evolve, inventors like Wen-Ben will play a crucial role in developing efficient and effective solutions for future challenges.