Troy, NY, United States of America

Weiwen Wu

This inventor holds 3 USPTO granted patents. Top assignee: Rensselaer Polytechnic Institute. Active years: 2025-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Weiwen Wu. Retrieved from https://idiyas.com/inventor/weiwen-wu-uxh7fzdu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 33.3

Average Co-Inventor Count = 5.1

ph-index = 1


Company Filing History:


Years Active: 2025-2026

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3 patents (USPTO):Explore Patents

Title: Innovations of Weiwen Wu in Image Reconstruction Technology.

Introduction

Weiwen Wu is an accomplished inventor based in Troy, NY (US). He has made significant contributions to the field of image reconstruction technology. His innovative work focuses on enhancing the quality and efficiency of imaging systems.

Latest Patents

Weiwen Wu holds a patent for a "Hybrid Image Reconstruction System." This system integrates a deep learning stage with a compressed sensing stage. The deep learning stage processes measured tomographic data to produce refined image outputs. It utilizes mapping circuitry and artificial neural networks to effectively map image domain data to a tomographic data domain. The compressed sensing stage further refines the output from the deep learning stage, resulting in high-quality image data.

Career Highlights

Weiwen Wu is affiliated with Rensselaer Polytechnic Institute, where he continues to advance research in imaging technologies. His work has garnered attention for its innovative approach to combining deep learning with traditional imaging techniques.

Collaborations

Weiwen Wu collaborates with notable colleagues, including Ge Wang and Wenxiang Cong, who contribute to his research endeavors.

Conclusion

Weiwen Wu's contributions to the field of image reconstruction exemplify the intersection of technology and innovation. His patent for a hybrid image reconstruction system showcases the potential for improved imaging techniques in various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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