Ota, Japan

Weijun Mai

This inventor holds 1 USPTO granted patent. Top assignee: Kabushiki Kaisha Toshiba. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Weijun Mai. Retrieved from https://idiyas.com/inventor/weijun-mai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Weijun Mai and Image-Based Depth Estimation

Introduction

Weijun Mai is an inventor associated with Kabushiki Kaisha Toshiba. The provided information lists Ota, Japan, as his location and credits him with 1 patent.

Latest Patents

Mai’s listed patent is titled “Information Processing Apparatus, Generation Method, and Computer Program Product Having an Estimation Model Used to Estimate Depth from an Image.” The invention describes an information processing apparatus with one or more hardware processors that update parameters for two estimation models. The models are optimized using loss functions that account for correspondence between pixels, depth, and differences in pixel values between corresponding pixels. The updated parameters are then used to generate the two estimation models.

Career Highlights

The available information highlights Mai’s work on image-based depth estimation and his association with Kabushiki Kaisha Toshiba. His patent describes a training approach that combines pixel correspondence, depth-related information, and pixel-value differences to develop estimation models.

Collaborations

The listed patent identifies Kabushiki Kaisha Toshiba as the company associated with Mai. No additional collaborators are specified in the provided information.

Conclusion

Weijun Mai’s listed patent focuses on generating estimation models for determining depth from images through processor-based training and optimization.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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