Company Filing History:
Years Active: 2014
Title: Innovations by Wei Zou in Defect Diagnosis Techniques
Introduction
Wei Zou is an accomplished inventor based in Portland, OR (US). He has made significant contributions to the field of defect diagnosis techniques, particularly in enhancing the speed and efficiency of these processes. His innovative approach has the potential to revolutionize how defects are diagnosed in electronic circuits.
Latest Patents
Wei Zou holds a patent for a method that speeds up defect diagnosis techniques. This patent focuses on fault diagnosis techniques, such as effect-cause diagnosis, which can be accelerated by utilizing a relatively small dictionary. The described technology demonstrates a remarkable speed increase of up to about 160 times in effect-cause diagnosis. This advancement allows for the diagnosis of defects using compacted fail data produced by test response compactors. By employing a small-sized dictionary, the size of the fault candidate list is reduced, facilitating the selection of a subset of passing patterns for simulation. Additionally, critical path tracing is utilized to manage failing patterns with a larger number of failing bits, while a pre-computed small dictionary aids in quickly identifying initial candidates for failing patterns with fewer failing bits. The patent also outlines exemplary techniques for selecting passing patterns for fault simulation to identify faults in electronic circuits.
Career Highlights
Wei Zou is currently associated with Mentor Graphics Corporation, where he continues to innovate and contribute to advancements in electronic design automation. His work has garnered attention for its practical applications and effectiveness in improving diagnostic techniques.
Collaborations
Wei Zou collaborates with notable colleagues, including Huaxing Tang and Wu-Tung Cheng, who share his commitment to advancing technology in the field of electronic diagnostics.
Conclusion
Wei Zou's innovative work in defect diagnosis techniques exemplifies the impact of effective problem-solving in technology. His contributions not only enhance diagnostic speed but also improve the overall efficiency of electronic circuit fault identification.