Hsinchu, Taiwan

Wei-Yuan Lee

This inventor holds 1 USPTO granted patent and 5 published patent applications. Top assignee: National Tsing Hua University. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wei-Yuan Lee. Retrieved from https://idiyas.com/inventor/wei-yuan-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 13.0

ph-index = 1


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Wei-Yuan Lee: Inventor in Radiopharmaceutical Research

Introduction

Wei-Yuan Lee is an inventor based in Hsinchu, Taiwan, and is associated with National Tsing Hua University. His work includes a patented method related to an iodine-labeled compound for imaging and studying cyclooxygenase distribution.

Latest Patents

Lee is credited with 1 patent. The patent describes a method for preparing [¹²³I]iodooctyl fenbufen amide, reporting a radiochemical yield of 15%, a specific activity of 37 GBq/μmol, and a radiochemical purity of 95%. It also describes using the compound as a tracer for single-photon emission computed tomography (SPECT) to estimate cyclooxygenase distribution. The invention proposes that the compound’s iodine-isotope binding characteristics, together with the association between inflammation and tumor lesions, may help assess tumor development and metastasis.

Career Highlights

Lee’s patent work connects radiochemistry with medical imaging research. The described approach focuses on preparing a radiolabeled compound and applying it in SPECT imaging.

Collaborations

Lee’s listed coworkers include Kun-Ju Lin and Shiou-Shiow Farn. His institutional affiliation is National Tsing Hua University.

Conclusion

Wei-Yuan Lee’s patent describes a radiochemical method and a potential SPECT imaging application for investigating cyclooxygenase distribution and tumor-related processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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