Company Filing History:
Years Active: 2023-2024
Title: Innovations of Wei Yin in 3D Measurement Technologies
Introduction
Wei Yin is a prominent inventor based in Nanjing, China. He has made significant contributions to the field of 3D measurement technologies, holding 2 patents that showcase his innovative approaches. His work focuses on high-precision methods for acquiring three-dimensional data, which have applications in various industries.
Latest Patents
Wei Yin's latest patents include a "High-precision dynamic real-time 360-degree omnidirectional point cloud acquisition method based on fringe projection." This invention utilizes fringe projection technology combined with a stereoscopic phase unwrapping method to acquire high-precision 3D data in real time. The method allows for low-cost, high-speed, and high-precision 3D real-time molding, opening new avenues in 360-degree workpiece surface defect detection and rapid reverse forming.
Another notable patent is the "Calibration method for fringe projection systems based on plane mirrors." This method involves using mirrors to capture 360-degree two-dimensional information of a measured object. By projecting phase-shifting fringe patterns and utilizing a temporal phase unwrapping algorithm, the system converts the absolute phase map into three-dimensional information. This innovative calibration method enhances measurement accuracy and enables high-precision panoramic three-dimensional measurement.
Career Highlights
Wei Yin is affiliated with the Nanjing University of Science and Technology, where he continues to advance research in 3D measurement technologies. His work has garnered attention for its practical applications and innovative methodologies.
Collaborations
Wei Yin collaborates with notable colleagues, including Chao Zuo and Jiaming Qian. Their combined expertise contributes to the development of cutting-edge technologies in their field.
Conclusion
Wei Yin's contributions to 3D measurement technologies reflect his innovative spirit and dedication to advancing the field. His patents demonstrate a commitment to enhancing measurement accuracy and efficiency, paving the way for future advancements in technology.