Taoyuan, Taiwan

Wei-Xu Cai

This inventor holds 1 USPTO granted patent. Top assignee: National Central University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wei-Xu Cai. Retrieved from https://idiyas.com/inventor/wei-xu-cai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Wei-Xu Cai and Data-Driven Measurement of Physical Properties.

Introduction

Wei-Xu Cai is an inventor associated with National Central University in Taoyuan, Taiwan. His patent work describes applying deep learning to estimate physical properties of a fluid from measurements of its mass flow through a vessel.

Latest Patents

Cai is credited with 1 patent: “Method of Measuring Physical Properties.” The method uses vessel shape information and training physical-property parameter sets to generate simulated mass-flow data. A deep-learning model is trained using the simulated data as input and the corresponding physical-property parameters as output. During measurement, fluid passes through an opening into a loader, and a scale records the loader’s accumulated weight over time. The resulting measured mass-flow data is then supplied to the model to estimate the fluid’s physical-property parameters.

Career Highlights

The patent highlights an approach that combines physical measurements, vessel geometry, and machine learning. By using weight accumulation over time to derive mass-flow data, the method connects an observable measurement to a model-based estimate of fluid properties.

Collaborations

The supplied information identifies Chun-Hung Weng as Cai’s coworker. It does not specify their roles or describe a particular collaboration on the patent.

Conclusion

Wei-Xu Cai’s patent presents a deep-learning method for estimating fluid properties from mass-flow measurements, reflecting the intersection of measurement technology and computational modeling.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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