Taipei, Taiwan

Wei-Wei Hsiung

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Qnap Systems, Inc.. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wei-Wei Hsiung. Retrieved from https://idiyas.com/inventor/wei-wei-hsiung-sifq4hyn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Innovations by Wei-Wei Hsiung

Introduction

Wei-Wei Hsiung is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of echo delay time estimation, showcasing his expertise through innovative methods and systems. His work is particularly relevant in applications that require precise signal processing.

Latest Patents

Wei-Wei Hsiung holds a patent for an "Echo delay time estimation method and system thereof." This invention simplifies the calculations involved in estimating echo delay time, thereby alleviating computational complexity. The method involves several steps, including receiving a testing signal and a received signal, executing time to frequency analysis, and generating spectrograms. It also includes dynamic detection calculations and cross-correlated vector estimations to accurately calculate echo delay time.

Career Highlights

Wei-Wei Hsiung is currently associated with Qnap Systems, Inc., where he applies his innovative skills to develop advanced technologies. His work at the company reflects his commitment to enhancing signal processing techniques and improving system efficiencies.

Conclusion

Wei-Wei Hsiung's contributions to echo delay time estimation highlight his innovative spirit and technical expertise. His patent demonstrates a significant advancement in the field, showcasing the importance of innovation in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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