Wei Wei

Title: Innovations of Wei Wei in X-ray Detection Technology

Introduction

Wei Wei is an accomplished inventor based in Lincoln, NE (US). He has made significant contributions to the field of X-ray detection technology, holding 2 patents that showcase his innovative approach to integrating materials for enhanced performance.

Latest Patents

Wei Wei's latest patents focus on the monolithic integration of hybrid perovskite single crystals with silicon for highly sensitive X-ray detectors. These patents describe X-ray radiation detector devices that include an X-ray wavelength-responsive active layer made of an organolead trihalide perovskite single crystal. The design features a substrate layer comprising an oxide and a binding layer positioned between the active layer and the substrate layer. This binding layer contains a binding molecule with a first functional group that bonds to the perovskite single crystal and a second functional group that bonds with the oxide. The inclusion of this binding layer effectively reduces device noise while maintaining signal intensity, marking a significant advancement in the field.

Career Highlights

Throughout his career, Wei Wei has worked with notable organizations such as Nutech Ventures and the University of Nebraska. His work in these institutions has allowed him to further develop his innovative ideas and contribute to advancements in technology.

Collaborations

Wei Wei has collaborated with Jinsong Huang, a fellow researcher, to enhance the development of his patented technologies. Their partnership has been instrumental in pushing the boundaries of X-ray detection capabilities.

Conclusion

Wei Wei's contributions to the field of X-ray detection through his innovative patents and collaborations highlight his role as a leading inventor in this area. His work continues to pave the way for advancements in sensitive detection technologies.