Puchong, Malaysia

Wei San Pang

This inventor holds 1 USPTO granted patent. Top assignee: Western Digital Technologies, Inc.. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wei San Pang. Retrieved from https://idiyas.com/inventor/wei-san-pang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Wei San Pang: Innovator in Data Storage Technology

Introduction

Wei San Pang is a notable inventor based in Puchong, Malaysia. He has made significant contributions to the field of data storage technology. His innovative approach has led to the development of a unique method for detecting power loss in data storage devices.

Latest Patents

Wei San Pang holds a patent for a method to detect power loss through data storage device spindle speed. This method involves measuring the rotational speed of a spindle in a rotating media during the initialization of a data storage device. By comparing the measured spindle speed to a threshold value, it can be determined whether the device initialization was triggered by a power-on reset.

Career Highlights

Wei San Pang is currently employed at Western Digital Technologies, Inc., a leading company in data storage solutions. His work focuses on enhancing the reliability and efficiency of data storage devices. His innovative contributions have positioned him as a key player in the industry.

Collaborations

Wei San Pang collaborates with his coworker, Cheng Fatt Yee, to further advance their projects in data storage technology.

Conclusion

Wei San Pang's innovative methods and dedication to improving data storage technology highlight his importance in the field. His contributions continue to shape the future of data storage solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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