Binhai New Area, China

Wei Long

This inventor holds 1 USPTO granted patent. Top assignee: China Oilfield Services, Limited. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wei Long. Retrieved from https://idiyas.com/inventor/wei-long-zgs8uhtj

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Wei Long: Inventor in Logging Image Definition Recognition.

Introduction

Wei Long is an inventor based in Binhai New Area, China, and is associated with China Oilfield Services, Limited. His patent work addresses image definition recognition for logging images.

Latest Patents

Wei Long is listed as an inventor on 1 patent: “Logging Image Definition Recognition Method and Device, Medium, and Electronic Equipment.” The disclosure describes creating a sample library of logging images, collecting actual definition information and algorithm-generated definitions for those images, and using the results to determine weights for image-definition algorithms. Those weighted algorithms are then used to assess the definition of a target logging image.

Career Highlights

The available information identifies Wei Long’s work in image definition recognition and his association with China Oilfield Services, Limited. His patent focuses on combining multiple algorithmic assessments with actual image-definition information.

Collaborations

The patent concerns logging-image analysis and is associated with Wei Long’s work at China Oilfield Services, Limited. No additional collaborators are identified in the provided information.

Conclusion

Wei Long’s disclosed invention applies weighted image-recognition algorithms to evaluate logging-image definition, reflecting a focused contribution to image analysis in the oilfield services context.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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