Shanghai, China

Wei Liang

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Shanghai Biren Technology Co., Ltd. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wei Liang. Retrieved from https://idiyas.com/inventor/wei-liang-wdh9929g

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Wei Liang - Innovator in Data Processing and Power Control Technologies

Introduction: Wei Liang is an accomplished inventor based in Shanghai, China. He is currently associated with Nio (Anhui) Holding Co., Ltd., where he focuses on developing innovative technologies in data processing and power control. Despite not having any granted patents, his contributions to the field are noteworthy.

Latest Patent Applications: Wei Liang has filed several patent applications that showcase his expertise. One of his latest applications is titled "Data Processing Method and Computing System." This application describes a method where multiple computing cores in a die collaborate to perform data reduction operations efficiently. Each core sends data and synchronization indicators to a reduction engine, which processes the data and generates results for the cores to read.

Another significant application is for a "Power Control Method and Device." This application outlines a method for modulating bit streams using different modulation schemes to achieve effective power control. The process involves modifying modulation symbols and performing power control processing before sending the combined modulation symbol to terminal devices.

Conclusion: Wei Liang's innovative work in data processing and power control methods highlights his potential as an inventor in the technology sector. His latest patent applications reflect a commitment to advancing these fields, even in the absence of granted patents.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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