Company Filing History:
1 out of 3,024 
1 out of 9 Years Active: 2015
Title: Innovations by Wei Jie Chen in Industrial Automation
Introduction
Wei Jie Chen is an accomplished inventor based in Westford, MA (US). He has made significant contributions to the field of industrial automation, particularly through his innovative work with time of flight (TOF) sensors. His inventions aim to enhance the efficiency and accuracy of object detection in industrial environments.
Latest Patents
Wei Jie Chen holds a patent for "Time of flight (TOF) sensors as replacement for standard photoelectric sensors." This patent outlines systems and methods for utilizing time of flight sensors in an industrial automation environment. The method includes employing a multi-pixel camera associated with a time of flight sensor to detect an object located within a defined or bounded target area. It involves comparing pixels with adjacent pixels associated with an image of the object captured by the multi-pixel camera. The invention identifies the object as being a colored, textured, or highly reflective object, and controls industrial machinery based on the identification of the object entering the target area. He has 1 patent to his name.
Career Highlights
Throughout his career, Wei Jie Chen has worked with notable companies such as Rockwell Automation Technologies Incorporated and Cedes Safety & Automation AG. His experience in these organizations has allowed him to develop and refine his innovative ideas in the field of automation technology.
Collaborations
Wei Jie Chen has collaborated with several professionals in his field, including Carl Meinherz and Craig Martin Brockman. These collaborations have contributed to the advancement of his projects and the successful implementation of his inventions.
Conclusion
Wei Jie Chen's work in the field of industrial automation, particularly with time of flight sensors, showcases his innovative spirit and dedication to improving technology. His contributions are paving the way for more efficient industrial processes and enhanced object detection methods.