Bayside, NY, United States of America

Wei-Fang Hsia

This inventor holds 1 USPTO granted patent. Top assignee: Giles Scientific, Inc.. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wei-Fang Hsia. Retrieved from https://idiyas.com/inventor/wei-fang-hsia

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 23(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: Wei-Fang Hsia and Microbiological Testing Innovation

Introduction

Wei-Fang Hsia is an inventor associated with Bayside, New York. His patent work includes an apparatus and method for automated microbiological testing, developed in connection with Giles Scientific, Inc.

Latest Patents

Hsia is credited with 1 patent: “Automatic Microbiological Testing Apparatus and Method.” The invention describes a system that uses electromagnetic waveform energy, a support for positioning a microbiological assay tray, and a linear color sensor. The tray contains wells with different reaction chemicals and microorganisms of the same type. The sensor receives radiation from a line of wells and generates signals encoding colorimetric data from the samples. This approach supports the investigation of multiple microbiological samples arranged in an assay tray.

Career Highlights

Hsia’s listed patent reflects work on automating the collection of colorimetric data in microbiological assays. The apparatus coordinates the tray, energy source, and sensor to examine samples in a consistent arrangement.

Collaborations

Hsia is associated with Giles Scientific, Inc. His listed coworkers include David L. Gibbs and Qi Wang.

Conclusion

Wei-Fang Hsia’s patent documents an automated approach to microbiological testing that uses a linear color sensor to gather data from assay-tray samples.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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