Wei-Cheng Kuo

Title: Innovations of Wei-Cheng Kuo

Introduction

Wei-Cheng Kuo is a notable inventor based in Taoyuan, Taiwan. He has made significant contributions to the field of electronic device testing and calibration systems. With a total of 2 patents, Kuo's work reflects his commitment to advancing technology in his industry.

Latest Patents

Kuo's latest patents include a position calibration system and method. This invention provides a control unit that manages a positioner sensing module to scan a circular positioner on a positioning substrate. The system acquires midpoints of two scanned line segments and determines an intersection of lines extending from these midpoints, establishing a calibration reference point. This reference point is crucial for positioning the substrate accurately and is stored in a memory unit. It serves as a positioning point during machine installation and aids in machine calibration.

Another significant patent is the multistory electronic device testing apparatus. This invention comprises a feeding and binning device, a multi-axis transfer device, a chip-testing device, and a main controller. The feeding and binning device consists of upper and lower modules, while the chip-testing device features multiple testing units arranged vertically. The main controller orchestrates the operations of feeding, binning, and testing, enhancing the capacity for testing electronic devices.

Career Highlights

Wei-Cheng Kuo is currently employed at Chroma Ate Inc., where he continues to innovate and develop advanced testing solutions. His work has positioned him as a key figure in the field of electronic device testing.

Collaborations

Kuo collaborates with talented coworkers, including Chin-Yi Ouyang and Chien-Ming Chen. Their combined expertise contributes to the success of their projects and innovations.

Conclusion

Wei-Cheng Kuo's contributions to the field of electronic device testing and calibration systems demonstrate his innovative spirit and technical expertise. His patents reflect a commitment to improving technology and enhancing the efficiency of electronic device testing processes.