Miaoli, Taiwan

Wei-chen Su

This inventor holds 1 USPTO granted patent. Top assignee: Foxsemicon Integrated Technology, Inc.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wei-chen Su. Retrieved from https://idiyas.com/inventor/wei-chen-su-hzu7qxrm

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Wei-chen Su: Innovator in Field Surveying Technology

Introduction

Wei-chen Su is a notable inventor based in Miaoli, Taiwan. He has made significant contributions to the field of surveying technology, particularly through his innovative patent that enhances the efficiency of field surveying and regulating processes.

Latest Patents

Wei-chen Su holds a patent for a "Field surveying and regulating system and method." This invention involves a method applied on at least one monitoring electronic device, allowing a manager to add projects and specific locations for obtaining soil samples. The method enables the manager to assign soil drills and operators for each project and location. It also provides comprehensive information regarding the position, depth, sampling time, actual work done, and photos of each soil drill during the sampling process.

Career Highlights

Wei-chen Su is currently employed at Foxsemicon Integrated Technology, Inc., where he continues to develop innovative solutions in the field of surveying technology. His work has been instrumental in advancing the capabilities of field surveying methods.

Collaborations

Wei-chen Su collaborates with Ching-wen Lin, contributing to the development of new technologies and methodologies in their field.

Conclusion

Wei-chen Su's contributions to field surveying technology exemplify the impact of innovation in enhancing operational efficiency. His patent reflects a commitment to improving surveying methods, showcasing the importance of technological advancements in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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