College Station, TX, United States of America

Wayne N P Hung

This inventor holds 1 USPTO granted patent. Top assignee: Texas A&M University System. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wayne N P Hung. Retrieved from https://idiyas.com/inventor/wayne-n-p-hung

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Wayne N P Hung: Innovator in Magnetic-Abrasive Polishing Technology

Introduction

Wayne N P Hung is a notable inventor based in College Station, TX (US). He has made significant contributions to the field of polishing technology through his innovative patent. His work focuses on enhancing the efficiency and effectiveness of polishing processes using advanced materials and techniques.

Latest Patents

Wayne N P Hung holds a patent for a "Method and apparatus for performing targeted polishing via manipulation of magnetic-abrasive fluid." This invention features a magnetic field manipulated localized polishing system that includes a container holding a volume of magnetic abrasive fluid. The fluid contains abrasive particles, and a motor positioned under the container induces rotation of a magnet. This setup allows for precise polishing of a workpiece suspended in the container.

Career Highlights

Wayne is affiliated with The Texas A&M University System, where he contributes to research and development in his area of expertise. His work has implications for various industries that require high-precision polishing techniques.

Collaborations

Wayne has collaborated with esteemed colleagues such as Satish Bukkapatnam and Arun Srinivasa, enhancing the scope and impact of his research.

Conclusion

Wayne N P Hung's innovative approach to polishing technology exemplifies the intersection of engineering and practical application. His contributions continue to influence advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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