Company Filing History:
Years Active: 1977
Title: Wayne L Glover: Innovator in Printed Circuit Board Testing
Introduction
Wayne L Glover is a notable inventor based in Odessa, FL (US). He has made significant contributions to the field of electrical engineering, particularly in the area of printed circuit board testing. His innovative approach has led to the development of a unique testing system that enhances the efficiency and accuracy of diagnosing faults in electronic circuits.
Latest Patents
Wayne L Glover holds 1 patent for his invention titled "Non-logic printed wiring board test system." This invention is an automatic printed circuit board tester designed to test printed circuit boards and diagnose faults in both digital and analog electrical circuit networks. The system integrates control, stimuli, and interconnection networks along with measuring instrumentation. A key feature of this invention is the automated fault isolation mechanism, which employs a moving probe assembly driven by stepping motors and controlled by a minicomputer. This fault isolation system effectively establishes a fault path from an output pin to a terminal point within the network, utilizing the location of the terminal point and a directed graph to identify potential failure branches.
Career Highlights
Wayne L Glover has had a distinguished career, working with Honeywell Information Systems Inc., where he has applied his expertise in electrical engineering to develop innovative solutions. His work has significantly impacted the efficiency of testing processes in the industry.
Collaborations
Throughout his career, Wayne has collaborated with several talented individuals, including Russell H Bowen and Allen L Clark. These collaborations have fostered an environment of innovation and creativity, leading to advancements in technology.
Conclusion
Wayne L Glover's contributions to the field of printed circuit board testing exemplify the spirit of innovation. His patented technology not only enhances testing accuracy but also streamlines the fault diagnosis process in electronic circuits. His work continues to influence the industry and inspire future advancements.