Company Filing History:
Years Active: 2015
Title: Wayne Kurowski: Innovator in Environmental Scanning Electron Microscopy
Introduction
Wayne Kurowski is a notable inventor based in Lake Oswego, Oregon. He has made significant contributions to the field of microscopy, particularly with his innovative patent related to environmental scanning electron microscopes.
Latest Patents
Wayne holds a patent for an Environmental Scanning Electron Microscope (ESEM/SEM) gas injection apparatus. This invention features a gas injection system that creates a localized region at the sample surface with sufficient gas concentration to be ionized by secondary electrons. This process helps neutralize charge on the sample surface. The gas concentration structure is designed to concentrate gas near the surface, and an optional hole allows the charged particle beam to impact the interior of a shrouded region. Additionally, an anode positioned near the surface enhances the number of ions returning to the workpiece surface for charge neutralization.
Career Highlights
Wayne has worked at FEI Company, where he has been able to apply his expertise in microscopy and contribute to advancements in the field. His work has been instrumental in improving the functionality and efficiency of electron microscopes.
Collaborations
Wayne has collaborated with notable colleagues, including Marc Castagna and Clive D. Chandler. Their combined efforts have contributed to the development of innovative technologies in microscopy.
Conclusion
Wayne Kurowski's contributions to the field of environmental scanning electron microscopy highlight his innovative spirit and dedication to advancing scientific research. His patent and work at FEI Company demonstrate the impact of his inventions on the industry.