Auburn, WA, United States of America

Wayne F Wenneman

This inventor holds 1 USPTO granted patent. Top assignee: The Boeing Company. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wayne F Wenneman. Retrieved from https://idiyas.com/inventor/wayne-f-wenneman

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Wayne F. Wenneman and His Patent for a High-Intensity Calibration Device.

Introduction

Wayne F. Wenneman is an inventor associated with Auburn, Washington, and The Boeing Company. His patent work includes a device designed to calibrate dynamic pressure sensors using an acoustic signal.

Latest Patents

Wenneman is credited with 1 patent: “High Intensity Calibration Device.” The invention describes a calibration system comprising a power/control box and a portable calibration head connected electrically to it. The head contains a speaker positioned within a housing and communicating with an opening in that housing. The power/control box can cause the speaker to emit an acoustic calibration signal, providing a means to calibrate a dynamic pressure sensor.

Career Highlights

The patent reflects Wenneman’s work on calibration technology and sensor testing. His association with The Boeing Company places this invention within an aerospace and engineering context, where reliable pressure measurements can be important.

Collaborations

The available information identifies Richard M. Gratzer and James Robert Underbrink as Wenneman’s coworkers. It does not specify whether they collaborated directly with him on this patent.

Conclusion

Wayne F. Wenneman’s patent for a high-intensity calibration device documents his contribution to acoustic calibration technology for dynamic pressure sensors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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