Snellville, GA, United States of America

Wayne Dwight Roomes Daley

This inventor holds 1 USPTO granted patent. Top assignee: Georgia Tech Research Corporation. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wayne Dwight Roomes Daley. Retrieved from https://idiyas.com/inventor/wayne-dwight-roomes-daley

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Wayne Dwight Roomes Daley: Innovator in Product Inspection Technologies

Introduction

Wayne Dwight Roomes Daley is an accomplished inventor based in Snellville, Georgia. He has made significant contributions to the field of product inspection, particularly in the food industry. His innovative approach to detecting defects in products has garnered attention and recognition.

Latest Patents

Wayne Daley holds a patent for "Systems and methods for inspecting natural or manufactured products." This patent focuses on systems and methods for inspecting food products, where contrast images are generated by subtracting reference data from an acquired sample image. The processing of this data on the contrast image results in improved defect detection, enhancing the quality assurance processes in food production.

Career Highlights

Daley is associated with the Georgia Tech Research Corporation, where he applies his expertise in developing advanced inspection technologies. His work has been instrumental in improving the standards of product safety and quality.

Collaborations

Wayne collaborates with Douglas F. Britton, leveraging their combined knowledge and skills to advance their research and development efforts.

Conclusion

Wayne Dwight Roomes Daley is a notable inventor whose work in product inspection technologies has the potential to significantly impact the food industry. His innovative methods for defect detection are paving the way for safer and higher-quality products.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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