Taichung, Taiwan

Wang-Chih Chen

This inventor holds 1 USPTO granted patent. Top assignee: Hiwin Technologies Corporation. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wang-Chih Chen. Retrieved from https://idiyas.com/inventor/wang-chih-chen-hdp7p3df

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Innovations by Wang-Chih Chen

Introduction

Wang-Chih Chen is a notable inventor based in Taichung, Taiwan. He has made significant contributions to the field of technology, particularly with his innovative designs and patents. His work focuses on enhancing the accuracy and efficiency of detection devices.

Latest Patents

Wang-Chih Chen holds a patent for a split detection device. This device includes a detection unit with a casing and a sensor mounted inside, a processing unit with a casing and a processor, a connection unit that links the sensor and processor, and a transmission unit that connects the processor to an external device. By separating the sensor and processor into different casings, the influence of the processor on the sensor is minimized, thereby improving detection accuracy. He has 1 patent to his name.

Career Highlights

Wang-Chih Chen is currently employed at Hiwin Technologies Corporation, where he continues to innovate and develop new technologies. His work at the company has positioned him as a key player in the advancement of detection devices.

Collaborations

Some of his coworkers include Yih-Chyun Hwang and Szu-Wei Yu, who contribute to the collaborative environment at Hiwin Technologies Corporation.

Conclusion

Wang-Chih Chen's contributions to the field of detection technology exemplify the impact of innovative thinking in engineering. His patent for the split detection device showcases his commitment to improving accuracy in technological applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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