Wan Wei

Title: Wan Wei - Innovator in Subsurface Formation Data Analysis

Introduction

Wan Wei is a prominent inventor based in Austin, TX, known for her innovative contributions to the field of subsurface formation data analysis. With a focus on improving the accuracy and efficiency of well data interpretation, she has made significant strides in the industry.

Latest Patents

Wan Wei holds a patent for the "Determination of representative elemental length based on subsurface formation data." This patent describes a method and system for forming Representative Elemental Length (REL) of well data. The method involves inputting log data from a borehole into an information handling system, identifying an initial length of the REL section, and dividing the log data into several REL investigation sections of equal length. It also includes calculating an average value of a formation property for each section and selecting maximum and minimum values. The system is designed to ensure stability in these values and derive formation properties for each REL section, ultimately forming a model of the formation.

Career Highlights

Wan Wei is currently employed at Landmark Graphics Corporation, where she applies her expertise in subsurface data analysis. Her work has been instrumental in advancing the methodologies used in the industry, making her a valuable asset to her team and the company.

Collaborations

Throughout her career, Wan Wei has collaborated with notable colleagues, including Travis St George Ramsay and Naveen Krishnaraj. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Wan Wei's contributions to the field of subsurface formation data analysis exemplify her dedication to innovation and excellence. Her patent and work at Landmark Graphics Corporation highlight her role as a leading inventor in this specialized area.