Seoul, South Korea

Wan-Sung Park

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wan-Sung Park. Retrieved from https://idiyas.com/inventor/wan-sung-park

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: The Innovations of Wan-Sung Park

Introduction

Wan-Sung Park is a notable inventor based in Seoul, South Korea. He has made significant contributions to the field of microscopy, particularly with his innovative designs and methods. His work is recognized for enhancing the capabilities of scanning probe microscopes.

Latest Patents

Wan-Sung Park holds a patent for a scanning probe microscope and a method of operating the same. This invention includes a chuck designed to fix an object securely. Additionally, it features a stacker that can load one or more cantilevers onto a head module. A stacker lifting element is also included, which allows for the movement of the stacker in an up and down direction. This patent showcases his expertise and creativity in advancing microscopy technology. He has 1 patent to his name.

Career Highlights

Wan-Sung Park is currently employed at Samsung Electronics Co., Ltd., a leading technology company known for its innovative products and solutions. His role at Samsung allows him to work on cutting-edge technologies and contribute to the company's research and development efforts.

Collaborations

Throughout his career, Wan-Sung Park has collaborated with talented individuals such as Sung-Ha Kim and Young-Hwan Kim. These collaborations have likely enriched his work and led to further advancements in their respective fields.

Conclusion

Wan-Sung Park is a distinguished inventor whose contributions to scanning probe microscopy have made a significant impact in the field. His innovative designs and methods continue to influence technology and research in microscopy.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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