Jincheon, South Korea

Wan Seop Jeong

This inventor holds 1 USPTO granted patent. Top assignee: Korea Basic Science Institute. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wan Seop Jeong. Retrieved from https://idiyas.com/inventor/wan-seop-jeong

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Innovations of Wan Seop Jeong in Mass Spectrometry.

Introduction

Wan Seop Jeong is a notable inventor based in Jincheon, South Korea. He has made significant contributions to the field of mass spectrometry, particularly with his innovative approach to ionization sources.

Latest Patents

Wan Seop Jeong holds a patent for a "Time-of-flight mass spectrometer using a cold electron beam as an ionization source." This invention includes an ionization part that receives electron beams to emit ions, a cold electron supply part that injects these beams, an ion detection part for detecting emitted ions, and an ion separation part connecting the ionization and detection components. The cold electron supply part utilizes a microchannel plate that receives ultraviolet rays to emit electron beams. The ions emitted pass through the ion separation part, which is designed in a straight tube shape, to reach the ion detection part.

Career Highlights

Wan Seop Jeong is affiliated with the Korea Basic Science Institute, where he continues to advance research in mass spectrometry. His work has been instrumental in enhancing the capabilities of time-of-flight mass spectrometers.

Collaborations

He collaborates with esteemed colleagues, including Seung Yong Kim and Hyun Sik Kim, who contribute to his research endeavors.

Conclusion

Wan Seop Jeong's innovative work in mass spectrometry exemplifies the importance of advancements in scientific instrumentation. His contributions are paving the way for future developments in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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