Goyang, South Korea

Wan-Joong Kim

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Electronics and Telecommunications Research Institute. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wan-Joong Kim. Retrieved from https://idiyas.com/inventor/wan-joong-kim-81u8mo3q

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 14(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: The Innovations of Wan-Joong Kim

Introduction

Wan-Joong Kim is a notable inventor based in Goyang, South Korea. He has made significant contributions to the field of optical measurement technology. His work focuses on enhancing the accuracy and efficiency of turbidity measurement.

Latest Patents

Wan-Joong Kim holds a patent for an "Optical cavity enhanced turbidimeter and turbidity measuring method." This innovative device allows for the calculation of turbidity within an optical cavity by analyzing the attenuation rate of an output beam after casting a pulse beam or a beam with a steep intensity gradient into the cavity. This advancement has the potential to improve various applications in environmental monitoring and quality control.

Career Highlights

Wan-Joong Kim is affiliated with the Electronics and Telecommunications Research Institute, where he continues to develop cutting-edge technologies. His expertise in optical measurement has positioned him as a key figure in his field.

Collaborations

He has collaborated with notable colleagues, including Jong-Cheol Hong and Gun Yong Sung, to further enhance the research and development of innovative technologies.

Conclusion

Wan-Joong Kim's contributions to optical measurement technology exemplify the impact of innovation in scientific research. His work not only advances the field but also sets a foundation for future developments in turbidity measurement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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