Munich, Germany

Waltraud Demharter

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Huntsman Textile Effects (Germany) Gmbh. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Waltraud Demharter. Retrieved from https://idiyas.com/inventor/waltraud-demharter

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Waltraud Demharter: Innovator in Textile Effects

Introduction

Waltraud Demharter is a notable inventor based in Altenmünster, Germany. She is currently associated with Huntsman Textile Effects GmbH, where she contributes her expertise in textile innovations. Despite having no patents to her name, her work in the textile industry is significant.

Latest Patents

Waltraud Demharter has not registered any patents as of now. However, her contributions to the field of textile effects are recognized through her collaborative efforts and innovative approaches.

Career Highlights

Throughout her career, Waltraud has been involved in various projects that focus on enhancing textile properties and sustainability. Her role at Huntsman Textile Effects GmbH has allowed her to work on cutting-edge technologies that aim to improve the quality and performance of textiles.

Collaborations

Waltraud has collaborated with several talented individuals, including Salman Dermeik and Andreas Eisele. These partnerships have fostered a creative environment that encourages innovation and the development of new textile solutions.

Conclusion

Waltraud Demharter is a dedicated professional in the textile industry, making strides in innovation and collaboration. Her work at Huntsman Textile Effects GmbH showcases her commitment to advancing textile technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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