This inventor holds 2 USPTO granted patents. Top assignee: Agfa Gevaert Nv. Active years: 1980-1981.
Company Filing History:
Years Active: 1980-1981
Title: Walter P Van Beeck: Innovator in Optical Inspection Technologies
Introduction
Walter P Van Beeck is a notable inventor based in Sinaai, Belgium. He has made significant contributions to the field of optical inspection technologies, particularly in the detection of defects in moving sheet materials. With a total of 2 patents to his name, Van Beeck's work has had a considerable impact on quality control processes in various industries.
Latest Patents
Van Beeck's latest patents include a "Method and device for inspecting a moving sheet material for streaklike defects." This innovative method allows for the detection of subtle streaklike defects in running webs and sheets by transversely scanning distinct lateral sections using lines of radiant energy. The system employs photocells that move synchronously with the radiant energy lines, enabling a large number of comparisons to identify defects effectively.
Another significant patent is the "Device for detecting irregularities in a moving sheet material." This device and method focus on the optical inspection of speck-like and streaklike defects in a moving web. It utilizes a source of radiation to illuminate a transverse zone of the web, while a series of photocells measure the radiation after transmission through or reflection from the web. A grating arrangement modulates the radiation received, enhancing the output signal of each cell.
Career Highlights
Walter P Van Beeck is currently associated with Agfa Gevaert NV, a company renowned for its imaging and printing solutions. His work at Agfa Gevaert has allowed him to apply his innovative ideas in practical settings, contributing to advancements in optical inspection technologies.
Collaborations
Throughout his career, Van Beeck has collaborated with notable colleagues, including Alfons J Dictus and Maurits Geens. These collaborations have fostered a creative environment that has led to the development of cutting-edge technologies in the field.
Conclusion
Walter P Van Beeck stands out as a key figure in the realm of optical inspection technologies. His patents reflect a commitment to innovation and quality, making significant strides in the detection of defects in moving materials. His contributions continue to influence the industry positively.