Munich, Germany

Walter Muller

This inventor holds 1 USPTO granted patent. Top assignee: Balzers Und Leybold Deutschland Holding Ag. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Walter Muller. Retrieved from https://idiyas.com/inventor/walter-muller-jbsmglzb

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: Walter Muller - Innovator in Optical Measuring Apparatus

Introduction

Walter Muller is a distinguished inventor based in Munich, Germany. He is known for his innovative contributions to optical measuring technology. His work focuses on the development of apparatuses that enhance the accuracy of chromaticity measurements in thin films.

Latest Patents

Walter Muller holds a patent for a "Process and apparatus for spectral reflectance and transmission." This optical measuring apparatus is designed to determine the chromaticity of thin films on a substrate. It includes a light source that illuminates the substrate and a measuring apparatus that disperses light into various wavelengths. The apparatus makes wavelength-dependent intensity measurements, ensuring precise results.

Career Highlights

Muller has made significant strides in the field of optical measurement. His patent addresses long-term and short-term instabilities in light sources, utilizing a white reference standard for correction. The apparatus is capable of normalizing measured relative spectral energy distributions, which enhances the accuracy of chromaticity measurements.

Collaborations

Walter Muller has collaborated with notable colleagues, including Peter Kappel and Werner Lenz. Their combined expertise has contributed to advancements in optical measuring technologies.

Conclusion

Walter Muller is a key figure in the field of optical measurement, with a focus on improving the accuracy of chromaticity assessments. His innovative patent reflects his commitment to advancing technology in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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