Munich, Germany

Walter Hirsch

This inventor holds 2 USPTO granted patents and 1 EPO patent. Top assignee: Deere & Company. Active years: 2000-2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Walter Hirsch. Retrieved from https://idiyas.com/inventor/walter-hirsch

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

 

Average Co-Inventor Count = 1.7

ph-index = 2

Forward Citations = 16(Granted Patents)


Company Filing History:


Years Active: 2000-2004

Loading Chart...
Loading Chart...
2 patents (USPTO):Explore Patents

Title: Walter Hirsch - Innovator at Deere & Company

Introduction

Walter Hirsch is an accomplished inventor based in Kirkel, Germany. He is currently associated with Deere & Company, a leading manufacturer in the agricultural and construction equipment industry. Despite having no patents to his name, his contributions to the field are noteworthy.

Latest Patents

Walter Hirsch currently holds 2 patents. This indicates that his work may focus more on collaborative projects or internal innovations rather than individual patent filings.

Career Highlights

Throughout his career at Deere & Company, Walter has been involved in various projects that enhance the efficiency and effectiveness of agricultural machinery. His role has allowed him to work closely with cutting-edge technology and innovative practices in the industry.

Collaborations

Walter has collaborated with notable coworkers such as Jason T Abbott and Dohn W Pfeiffer. These partnerships have likely contributed to the development of new ideas and improvements within the company.

Conclusion

Walter Hirsch is a dedicated inventor whose work at Deere & Company reflects his commitment to innovation in the agricultural sector. His collaborative efforts with colleagues further enhance the potential for advancements in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…