This inventor holds 1 USPTO granted patent. Top assignee: Infinitum Solutions, Inc.. Active years: 2013.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2013
Title: Walter G Bankshak, Jr: Innovator in Hard Disk Drive Testing
Introduction
Walter G Bankshak, Jr. is a notable inventor based in Morgan Hill, California. He has made significant contributions to the field of hard disk drive technology. His innovative approach has led to the development of a unique testing mechanism for flex and APFA assemblies.
Latest Patents
Walter holds a patent for a device designed to test hard disk drive (HDD) flex circuits prior to the electrical installation of a Head Gimbal Assembly (HGA). This tester features a shorting block that establishes electrical contact with the bondpads on the sample. The design of the shorting block includes multiple electrical contacts that are grounded and configured to engage with both the bondpads and the surrounding surface of the sample. This allows for positioning tolerances without the need for optics, precise probes, or precision stages. During the testing process, the bondpads are shorted together and to ground, enabling the detection of short failures. Additionally, the device assesses whether open failures are properly identified when the shorting block is disengaged.
Career Highlights
Walter G Bankshak, Jr. is currently employed at Infinitum Solutions, Inc., where he continues to innovate in the field of hard disk drive technology. His work has been instrumental in enhancing the reliability and efficiency of HDD testing processes.
Collaborations
Walter has collaborated with notable colleagues such as Wade A Ogle and Henry Patland, contributing to advancements in their shared field of expertise.
Conclusion
Walter G Bankshak, Jr. exemplifies the spirit of innovation in technology, particularly in the realm of hard disk drives. His contributions have paved the way for improved testing methods, showcasing his dedication to advancing engineering practices.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
