Kakamigahara, Japan

Wakana Yamamoto

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignees: Nagoya University, Nikon Corporation. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wakana Yamamoto. Retrieved from https://idiyas.com/inventor/wakana-yamamoto

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Wakana Yamamoto - Innovator in Incubation Technology

Introduction

Wakana Yamamoto is an inventor based in Kakamigahara-shi, Japan. She has made significant contributions to the field of incubation technology, particularly through her innovative patent applications. Although she currently holds no granted patents, her work demonstrates a commitment to advancing scientific understanding and technology.

Latest Patent Applications

Wakana Yamamoto's notable patent application includes the "INCUBATED STATE EVALUATING DEVICE, INCUBATED STATE EVALUATING METHOD, INCUBATOR, AND PROGRAM." This application describes an incubated state evaluating device that comprises several key components. The image reading unit captures a series of images of cells incubated in a container over time. The feature value calculating unit extracts morphological features of the cells from these images. The frequency distribution calculating unit analyzes the frequency distributions of these feature values across the images. Finally, the evaluation information generating unit produces evaluation information that assesses the incubated state of the cells based on variations in frequency distributions.

Conclusion

Wakana Yamamoto's innovative approach to evaluating incubated states showcases her dedication to enhancing incubation technology. Her contributions, although not yet reflected in granted patents, highlight the potential for future advancements in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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