Hong Kong, China

Wai Yip Cheung

This inventor holds 1 USPTO granted patent. Top assignees: The Hong Kong University of Science and Technology, University of Macau. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wai Yip Cheung. Retrieved from https://idiyas.com/inventor/wai-yip-cheung

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Innovations of Wai Yip Cheung

Introduction

Wai Yip Cheung is a notable inventor based in Hong Kong, CN. He has made significant contributions to the field of UV detection technology. His innovative work has led to the development of a unique solar-blind UV radiation detector.

Latest Patents

Wai Yip Cheung holds 1 patent for his invention of the MgS solar-blind UV radiation detector. This device is designed to provide a photoresponse with a cutoff wavelength below a predetermined wavelength. The detector utilizes a sensor element with an active layer comprising a MgS component that is grown directly on a substrate. Additionally, a thin metal layer is deposited over the active layer, forming a transparent Schottky metal layer.

Career Highlights

Throughout his career, Wai Yip Cheung has worked with prestigious institutions such as the University of Macau and The Hong Kong University of Science and Technology. His experience in these academic environments has allowed him to advance his research and contribute to the scientific community.

Collaborations

Wai Yip Cheung has collaborated with notable colleagues, including Shu Kin Lok and Iam Keong Sou. Their joint efforts have furthered advancements in the field of UV detection.

Conclusion

Wai Yip Cheung's innovative contributions to UV detection technology highlight his expertise and dedication to scientific advancement. His work continues to influence the field and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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