Seattle, WA, United States of America

Wai-Fai Chin


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 1999-2001

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2 patents (USPTO):Explore Patents

Title: The Innovations of Wai-Fai Chin

Introduction

Wai-Fai Chin is a prominent inventor based in Seattle, WA, known for her contributions to optical scanning technology. With a total of two patents to her name, she has made significant advancements in the field of laser bar code scanning.

Latest Patents

Wai-Fai Chin's latest patents include an innovative optical scanning device. This device employs a retroreflector in combination with a rotating polygon reflector to increase scan width and reduce curvature in the scanning beam. This technology enhances the efficiency and accuracy of bar code scanning, making it a valuable asset in various industries.

Career Highlights

Chin works at Microscan Systems Incorporated, where she has played a crucial role in developing cutting-edge scanning solutions. Her expertise and dedication have contributed to the company's reputation as a leader in optical scanning technology.

Collaborations

Some of her notable coworkers include James E. Thomas and Bruce R. Scharf, who have collaborated with her on various projects within the company.

Conclusion

Wai-Fai Chin's innovative work in optical scanning technology has made a lasting impact on the industry. Her patents reflect her commitment to advancing technology and improving efficiency in bar code scanning.

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