San Jose, CA, United States of America

Wade Lenn Jensen


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Wade Lenn Jensen: Innovator in Electron Beam Inspection Technology

Introduction

Wade Lenn Jensen is a notable inventor based in San Jose, California. He has made significant contributions to the field of electron beam inspection technology. His innovative work has led to the development of a patent that enhances defect detection processes.

Latest Patents

Wade Lenn Jensen holds a patent titled "Enhanced defect detection in electron beam inspection and review." This invention relates to an electron beam apparatus designed for inspection and review. The apparatus includes an electron source that generates a primary electron beam, along with an electron-optics system that shapes and focuses this beam onto a sample held by a stage. A detection system is employed to detect signal-carrying electrons, including secondary and back-scattered electrons from the sample. Additionally, an image processing system processes data from the detection system. The host computer system coordinates the operations of the electron-optics system, detection system, and image processing system. A graphical user interface allows users to select and activate operating parameters of the apparatus. The patent also describes methods for detecting and reviewing defects using the electron beam apparatus.

Career Highlights

Wade Lenn Jensen is associated with Kla Tencor Corporation, where he has been instrumental in advancing electron beam inspection technologies. His work has contributed to the company's reputation as a leader in the field of semiconductor inspection and metrology.

Collaborations

Wade has collaborated with talented coworkers, including Gary Fan and Kumar Raja Guvindan Raju. Their combined expertise has fostered innovation and development within their projects.

Conclusion

Wade Lenn Jensen's contributions to electron beam inspection technology exemplify the impact of innovative thinking in the field. His patent and work at Kla Tencor Corporation highlight the importance of advancements in defect detection processes.

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