Flagstaff, AZ, United States of America

W Edward Farnam, Iii

This inventor holds 1 USPTO granted patent. Top assignee: Hemosense, Inc.. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: W Edward Farnam, Iii. Retrieved from https://idiyas.com/inventor/w-edward-farnam-iii

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 38(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: W Edward Farnam, III: Innovator in Measurement Technology

Introduction

W Edward Farnam, III is a notable inventor based in Flagstaff, AZ (US). He has made significant contributions to the field of measurement technology, particularly in the development of devices that enhance the accuracy of sample analysis. His work is characterized by a commitment to innovation and precision.

Latest Patents

Farnam holds a patent for a "Device and method for measuring properties of a sample." This invention includes test strips designed to prevent or reduce false results when measuring the condition of a sample. The test strips can be utilized for analysis through various methods, including electrical and optical measurements. Notably, these reagent test strips are particularly suited for detecting blood coagulation.

Career Highlights

Farnam's career is marked by his role at Hemosense, Inc., where he has been instrumental in advancing measurement technologies. His expertise in developing reliable testing methods has positioned him as a key figure in the industry.

Collaborations

Farnam collaborates with talented professionals, including his coworker Maria C Navarro, to further enhance the capabilities of their innovations.

Conclusion

W Edward Farnam, III's contributions to measurement technology exemplify the impact of innovative thinking in the field. His dedication to improving testing methods continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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