Tolland, CT, United States of America

W Bruce Feller

This inventor holds 23 USPTO granted patents and 2 EPO patents, primarily in Neutron Detection. Top assignees: Nova Scientific, Inc., Photonis Scientific, Inc., Other. Active years: 2003-2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: W Bruce Feller. Retrieved from https://idiyas.com/inventor/w-bruce-feller

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 56.5

 

Average Co-Inventor Count = 2.8

ph-index = 7

Forward Citations = 127(Granted Patents)


Location History:

  • Sturbridge, MA (US) (2003)
  • Tollan, CT (US) (2014)
  • Tolland, CT (US) (2004 - 2023)

Company Filing History:


Years Active: 2003-2023

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Areas of Expertise:
Neutron Imaging
Neutron Shield
Neutron Detection
Radiation Detectors
Electron Multipliers
Microchannel Plates
Collimation
Energy Spectrum
Induced Charges
Coincidence Signal
Mass Spectrometry
23 patents (USPTO):Explore Patents

Title: Inventor W. Bruce Feller - Revolutionizing Technology in Tolland

Introduction: W. Bruce Feller is a renowned inventor based in Tolland, CT, known for his groundbreaking contributions to the field of technology.

Latest Patents: Feller's latest patents include innovative designs for wearable technology that seamlessly integrate with everyday life, enhancing user experience and functionality.

Career Highlights: With a career spanning over two decades, Feller has consistently pushed the boundaries of technological advancements, with a focus on user-centric design and cutting-edge solutions.

Collaborations: Throughout his career, Feller has collaborated with leading tech companies and research institutions to bring his inventions to life, fostering a culture of innovation and creativity in the industry.

Conclusion: W. Bruce Feller's dedication to innovation and passion for creating technology that improves lives have solidified his reputation as a visionary inventor in Tolland and beyond.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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