Würselen, Germany

Volker Sturm

This inventor holds 1 USPTO granted patent. Top assignee: Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.v.. Active years: 1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Volker Sturm. Retrieved from https://idiyas.com/inventor/volker-sturm-wo2guf4l

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 1993

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1 patent (USPTO):Explore Patents

Title: The Innovations of Volker Sturm

Introduction

Volker Sturm is a notable inventor based in Würselen, Germany. He has made significant contributions to the field of laser technology, particularly in measuring radiation capacity. His work is recognized for its impact on various applications in science and industry.

Latest Patents

Volker Sturm holds a patent for an "Apparatus for measuring the radiation capacity of lasers." This invention showcases his expertise and innovative approach to enhancing laser measurement techniques. He has 1 patent to his name, reflecting his commitment to advancing technology in this area.

Career Highlights

Sturm is affiliated with the Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., a leading research organization in Germany. His role at this esteemed institution allows him to collaborate with other experts and contribute to groundbreaking research in applied sciences.

Collaborations

Throughout his career, Volker Sturm has worked alongside talented colleagues, including Peter Loosen and Alexander J. Drenker. These collaborations have fostered an environment of innovation and have led to advancements in their respective fields.

Conclusion

Volker Sturm's contributions to laser technology and his innovative patent demonstrate his dedication to scientific advancement. His work continues to influence the field and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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