Berlin, Germany

Volker Koehler

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Trimble Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Volker Koehler. Retrieved from https://idiyas.com/inventor/volker-koehler-9jkghph1

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Volker Koehler and Mobile Scanning Surveying

Introduction

Volker Koehler is an inventor associated with Berlin, Germany, and Trimble Inc. His patent work concerns surveying technology that can switch between stationary and mobile scanning.

Latest Patents

Koehler is associated with 1 patent, titled “Stationary and Mobile Scanning Operations.” The patent describes a scanning surveying system with a base, a rotatable alidade, a rotating optical element, motors, an optical distance-measuring unit, a motion sensor, and a controller. The controller can perform stationary scans and automatically begin mobile scanning when the sensor detects movement. It can also register point-cloud data collected during stationary and mobile operations.

Career Highlights

Koehler’s listed invention focuses on adapting surveying scans to whether the system is stationary or moving. This approach supports the collection and registration of point-cloud data across both operating modes. He is associated with Trimble Inc.

Collaborations

The available information identifies Trimble Inc. as Koehler’s company affiliation. It does not specify additional collaborators or co-inventors for the patent.

Conclusion

Volker Koehler’s patent work centers on a surveying system that combines stationary and motion-triggered mobile scanning, reflecting an effort to make point-cloud data collection more adaptable.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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