Wuppertal, Germany

Volker K Deutsch


Average Co-Inventor Count = 1.8

ph-index = 2

Forward Citations = 20(Granted Patents)


Company Filing History:


Years Active: 1982-1992

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3 patents (USPTO):Explore Patents

Title: Volker K Deutsch: Innovator in Measurement Technologies

Introduction

Volker K Deutsch is a notable inventor based in Wuppertal, Germany. He has made significant contributions to the field of measurement technologies, holding three patents that showcase his innovative spirit and technical expertise.

Latest Patents

One of his latest patents is a method and means for measuring the depth of cracks. This invention utilizes a potential probe connected to a measuring instrument, which includes two current terminals and additional voltage-measuring terminals. The objective of this invention is to eliminate the need for separate calibration devices, allowing for simultaneous check measurements during the actual depth-measuring process. Another significant patent is a method of and apparatus for layer thickness measurement. This invention measures the coating thickness of non-magnetic substances on ferromagnetic materials using a magneto-inductive method. The probe's coil inductance is evaluated to determine the thickness of the layer, with adjustments made to account for the specimen's geometry and magnetic properties.

Career Highlights

Throughout his career, Volker K Deutsch has worked with prominent companies such as Karl Deutsch Prüf- und Messgerätebau GmbH & Co. KG and Estel Hoesch Werke Aktiengesellschaft. His experience in these organizations has contributed to his development as an inventor and innovator in measurement technologies.

Collaborations

Volker K Deutsch has collaborated with notable individuals in his field, including Werner F Roddeck and Hermann J Kopineck. These collaborations have likely enriched his work and expanded his contributions to measurement technologies.

Conclusion

Volker K Deutsch is a distinguished inventor whose work in measurement technologies has led to innovative patents that enhance the accuracy and efficiency of various measurement processes. His contributions continue to impact the field positively.

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